Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis.
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| Title: | Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis. |
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| Authors: | Tolstygin, K. D.1,2 (AUTHOR) kirill.tolstygin@yandex.ru, Romanenko, K. A.2 (AUTHOR) romanenko_ka@esoil.ru, Korostylev, E. V.3 (AUTHOR) korostylev.ev@mipt.ru, Parochkin, A. V.3 (AUTHOR) parochkin.av@mipt.ru, Skvortsova, E. B.2 (AUTHOR) eskvora@mail.ru, Gerke, K. M.3,4 (AUTHOR) gerke.km@mipt.ru |
| Source: | Moscow University Soil Science Bulletin. Mar2026, Vol. 81 Issue 1, p123-132. 10p. |
| Database: | Environment Complete |
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