APA (7th ed.) Citation

Naik, B. C., Sevagan, S., Kamalakannan, B., Derllinraj, N., & Gopi, V. P. (2026). Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures. Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), 51(8), 10989. https://doi.org/10.1007/s13369-025-10870-y

Chicago Style (17th ed.) Citation

Naik, Bukke Chandrababu, S. Sevagan, Bharath Kamalakannan, N. Derllinraj, and Varun P. Gopi. "Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures." Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ) 51, no. 8 (2026): 10989. https://doi.org/10.1007/s13369-025-10870-y.

MLA (9th ed.) Citation

Naik, Bukke Chandrababu, et al. "Hybrid Wafer Defect Detection and Segmentation Using Verilog-Based Image Preprocessing and Deep Learning Architectures." Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), vol. 51, no. 8, 2026, p. 10989, https://doi.org/10.1007/s13369-025-10870-y.