Efficient Standard Errors in Item Response Theory Models for Short Tests
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| Title: | Efficient Standard Errors in Item Response Theory Models for Short Tests |
|---|---|
| Language: | English |
| Authors: | Ippel, Lianne (ORCID |
| Source: | Educational and Psychological Measurement. Jun 2020 80(3):461-475. |
| Availability: | SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: http://sagepub.com |
| Peer Reviewed: | Y |
| Page Count: | 15 |
| Publication Date: | 2020 |
| Document Type: | Journal Articles Reports - Research |
| Descriptors: | Item Response Theory, Error of Measurement, Accuracy, Standards, Guidelines, Models, Test Format, Item Analysis, Maximum Likelihood Statistics, Mathematical Formulas |
| DOI: | 10.1177/0013164419882072 |
| ISSN: | 0013-1644 |
| Abstract: | In dichotomous item response theory (IRT) framework, the asymptotic standard error (ASE) is the most common statistic to evaluate the precision of various ability estimators. Easy-to-use ASE formulas are readily available; however, the accuracy of some of these formulas was recently questioned and new ASE formulas were derived from a general asymptotic theory framework. Furthermore, exact standard errors were suggested to better evaluate the precision of ability estimators, especially with short tests for which the asymptotic framework is invalid. Unfortunately, the accuracy of exact standard errors was assessed so far only in a very limiting setting. The purpose of this article is to perform a global comparison of exact versus (classical and new formulations of) asymptotic standard errors, for a wide range of usual IRT ability estimators, IRT models, and with short tests. Results indicate that exact standard errors globally outperform the ASE versions in terms of reduced bias and root mean square error, while the new ASE formulas are also globally less biased than their classical counterparts. Further discussion about the usefulness and practical computation of exact standard errors are outlined. |
| Abstractor: | As Provided |
| Entry Date: | 2020 |
| Accession Number: | EJ1253240 |
| Database: | ERIC |
| FullText | Text: Availability: 0 |
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| Header | DbId: eric DbLabel: ERIC An: EJ1253240 AccessLevel: 3 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Efficient Standard Errors in Item Response Theory Models for Short Tests – Name: Language Label: Language Group: Lang Data: English – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Ippel%2C+Lianne%22">Ippel, Lianne</searchLink> (ORCID <externalLink term="https://orcid.org/0000-0001-8314-0305">0000-0001-8314-0305</externalLink>)<br /><searchLink fieldCode="AR" term="%22Magis%2C+David%22">Magis, David</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="SO" term="%22Educational+and+Psychological+Measurement%22"><i>Educational and Psychological Measurement</i></searchLink>. Jun 2020 80(3):461-475. – Name: Avail Label: Availability Group: Avail Data: SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: http://sagepub.com – Name: PeerReviewed Label: Peer Reviewed Group: SrcInfo Data: Y – Name: Pages Label: Page Count Group: Src Data: 15 – Name: DatePubCY Label: Publication Date Group: Date Data: 2020 – Name: TypeDocument Label: Document Type Group: TypDoc Data: Journal Articles<br />Reports - Research – Name: Subject Label: Descriptors Group: Su Data: <searchLink fieldCode="DE" term="%22Item+Response+Theory%22">Item Response Theory</searchLink><br /><searchLink fieldCode="DE" term="%22Error+of+Measurement%22">Error of Measurement</searchLink><br /><searchLink fieldCode="DE" term="%22Accuracy%22">Accuracy</searchLink><br /><searchLink fieldCode="DE" term="%22Standards%22">Standards</searchLink><br /><searchLink fieldCode="DE" term="%22Guidelines%22">Guidelines</searchLink><br /><searchLink fieldCode="DE" term="%22Models%22">Models</searchLink><br /><searchLink fieldCode="DE" term="%22Test+Format%22">Test Format</searchLink><br /><searchLink fieldCode="DE" term="%22Item+Analysis%22">Item Analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Maximum+Likelihood+Statistics%22">Maximum Likelihood Statistics</searchLink><br /><searchLink fieldCode="DE" term="%22Mathematical+Formulas%22">Mathematical Formulas</searchLink> – Name: DOI Label: DOI Group: ID Data: 10.1177/0013164419882072 – Name: ISSN Label: ISSN Group: ISSN Data: 0013-1644 – Name: Abstract Label: Abstract Group: Ab Data: In dichotomous item response theory (IRT) framework, the asymptotic standard error (ASE) is the most common statistic to evaluate the precision of various ability estimators. Easy-to-use ASE formulas are readily available; however, the accuracy of some of these formulas was recently questioned and new ASE formulas were derived from a general asymptotic theory framework. Furthermore, exact standard errors were suggested to better evaluate the precision of ability estimators, especially with short tests for which the asymptotic framework is invalid. Unfortunately, the accuracy of exact standard errors was assessed so far only in a very limiting setting. The purpose of this article is to perform a global comparison of exact versus (classical and new formulations of) asymptotic standard errors, for a wide range of usual IRT ability estimators, IRT models, and with short tests. Results indicate that exact standard errors globally outperform the ASE versions in terms of reduced bias and root mean square error, while the new ASE formulas are also globally less biased than their classical counterparts. Further discussion about the usefulness and practical computation of exact standard errors are outlined. – Name: AbstractInfo Label: Abstractor Group: Ab Data: As Provided – Name: DateEntry Label: Entry Date Group: Date Data: 2020 – Name: AN Label: Accession Number Group: ID Data: EJ1253240 |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eric&AN=EJ1253240 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1177/0013164419882072 Languages: – Text: English PhysicalDescription: Pagination: PageCount: 15 StartPage: 461 Subjects: – SubjectFull: Item Response Theory Type: general – SubjectFull: Error of Measurement Type: general – SubjectFull: Accuracy Type: general – SubjectFull: Standards Type: general – SubjectFull: Guidelines Type: general – SubjectFull: Models Type: general – SubjectFull: Test Format Type: general – SubjectFull: Item Analysis Type: general – SubjectFull: Maximum Likelihood Statistics Type: general – SubjectFull: Mathematical Formulas Type: general Titles: – TitleFull: Efficient Standard Errors in Item Response Theory Models for Short Tests Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Ippel, Lianne – PersonEntity: Name: NameFull: Magis, David IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 0013-1644 Numbering: – Type: volume Value: 80 – Type: issue Value: 3 Titles: – TitleFull: Educational and Psychological Measurement Type: main |
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