Self and Peer Assessment of Mathematical Processes

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Bibliographic Details
Title: Self and Peer Assessment of Mathematical Processes
Language: English
Authors: Onion, Alice, Javaheri, Elnaz
Source: Mathematics Teaching. Sep 2011 (224):30-32.
Availability: Association of Teachers of Mathematics. Unit 7 Prime Industrial Park, Shaftesbury Street, Derby, DE23 8YB, UK. Tel: +44-1332-346599; e-mail: admin@atm.org.uk; Web site: http://www.atm.org.uk/mt/index.html
Peer Reviewed: N
Page Count: 3
Publication Date: 2011
Document Type: Journal Articles
Reports - Descriptive
Education Level: Grade 8
Descriptors: Self Evaluation (Individuals), Peer Evaluation, Mathematics Instruction, Mathematics Skills, Mathematical Concepts, Grade 8, Foreign Countries, Thinking Skills, Mathematical Logic, Novelty (Stimulus Dimension)
Geographic Terms: United Kingdom
ISSN: 0025-5785
Abstract: This article explores using Bowland assessment tasks and Nuffield Applying Mathematical Processes (AMP) activities as part of a scheme of work. The Bowland tasks and Nuffield AMP activities are designed to develop students' mathematical thinking; they are focused on key processes. Unfamiliar demands are made on the students and they are challenged to think about their own approaches to solving problems. This innovative work was done with a lower set Year 8--set 4 out of 6--over the course of just over a term.
Abstractor: ERIC
Entry Date: 2012
Access URL: https://www.atm.org.uk/journal/archive/mt224.html
Accession Number: EJ956260
Database: ERIC
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Description
Abstract:This article explores using Bowland assessment tasks and Nuffield Applying Mathematical Processes (AMP) activities as part of a scheme of work. The Bowland tasks and Nuffield AMP activities are designed to develop students' mathematical thinking; they are focused on key processes. Unfamiliar demands are made on the students and they are challenged to think about their own approaches to solving problems. This innovative work was done with a lower set Year 8--set 4 out of 6--over the course of just over a term.
ISSN:0025-5785