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USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.

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Title: USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.
Alternate Title: EMPLEO DE MEÍTODO DE CONVOLUCIOÍN A INTERVALOS LINEALES EN PERFILES DE DIFRACCIOÍN DE RAYOS-X.
Authors: RODRÍGUEZ-HERRERA, D. M.1, PENTON-MADRIGAI, A.2 arbelio@fisica.uh.cu, ESTEVEZ-RAMS, E.2
Source: Revista Cubana de Física. 7/15/2024, Vol. 41 Issue 1, p16-21. 6p.
Subjects: CRYSTAL structure, DIFFRACTION patterns, SET functions, X-ray diffraction
Abstract (English): A mathematical formalism for calculating the intrinsic profile of a diffraction maximum through a convolution process using a set of linear functions by intervals is presented. This convolution process is implemented in the formalism for the direct solution of a diffraction pattern of a layered crystalline structure affected by planar defects. It allows the correlation length (AC) to be calculated, which describes the degree of disorder in this type of crystalline structure. The obtained result is validated through the Warren-Averbach method for microstructural analysis. [ABSTRACT FROM AUTHOR]
Abstract (Spanish): Se presenta un formalismo matemaÍ tico para el caÍ lculo del perfil intrínseco de un máximo de difracción a través de un proceso de convolucioÍ n usando un conjunto de funciones lineales por intervalos. Este proceso de convolucioí n es implementado en el formalismo para la solucioí n directa de un patroí n de difraccioín de una estructura cristalina de capas afectada por defectos planares. Este procedimiento permite calcular la longitud de correlacion (AC), cantidad que describe el grado de desorden en este tipo de estructuras cristalinas. El resultado obtenido es validado a traveís del metodo de Warren - Averbach para el analisis microestructural. [ABSTRACT FROM AUTHOR]
Copyright of Revista Cubana de Física is the property of Universidad de La Habana and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: MedicLatina
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PubType: Academic Journal
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  Data: USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.
– Name: TitleAlt
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  Data: EMPLEO DE MEÍTODO DE CONVOLUCIOÍN A INTERVALOS LINEALES EN PERFILES DE DIFRACCIOÍN DE RAYOS-X.
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  Data: <searchLink fieldCode="AR" term="%22RODRÍGUEZ-HERRERA%2C+D%2E+M%2E%22">RODRÍGUEZ-HERRERA, D. M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22PENTON-MADRIGAI%2C+A%2E%22">PENTON-MADRIGAI, A.</searchLink><relatesTo>2</relatesTo><i> arbelio@fisica.uh.cu</i><br /><searchLink fieldCode="AR" term="%22ESTEVEZ-RAMS%2C+E%2E%22">ESTEVEZ-RAMS, E.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Revista+Cubana+de+Física%22">Revista Cubana de Física</searchLink>. 7/15/2024, Vol. 41 Issue 1, p16-21. 6p.
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22CRYSTAL+structure%22">CRYSTAL structure</searchLink><br /><searchLink fieldCode="DE" term="%22DIFFRACTION+patterns%22">DIFFRACTION patterns</searchLink><br /><searchLink fieldCode="DE" term="%22SET+functions%22">SET functions</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink>
– Name: Abstract
  Label: Abstract (English)
  Group: Ab
  Data: A mathematical formalism for calculating the intrinsic profile of a diffraction maximum through a convolution process using a set of linear functions by intervals is presented. This convolution process is implemented in the formalism for the direct solution of a diffraction pattern of a layered crystalline structure affected by planar defects. It allows the correlation length (AC) to be calculated, which describes the degree of disorder in this type of crystalline structure. The obtained result is validated through the Warren-Averbach method for microstructural analysis. [ABSTRACT FROM AUTHOR]
– Name: Abstract
  Label: Abstract (Spanish)
  Group: Ab
  Data: Se presenta un formalismo matemaÍ tico para el caÍ lculo del perfil intrínseco de un máximo de difracción a través de un proceso de convolucioÍ n usando un conjunto de funciones lineales por intervalos. Este proceso de convolucioí n es implementado en el formalismo para la solucioí n directa de un patroí n de difraccioín de una estructura cristalina de capas afectada por defectos planares. Este procedimiento permite calcular la longitud de correlacion (AC), cantidad que describe el grado de desorden en este tipo de estructuras cristalinas. El resultado obtenido es validado a traveís del metodo de Warren - Averbach para el analisis microestructural. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Revista Cubana de Física is the property of Universidad de La Habana and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Text: English
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        StartPage: 16
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      – SubjectFull: CRYSTAL structure
        Type: general
      – SubjectFull: DIFFRACTION patterns
        Type: general
      – SubjectFull: SET functions
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      – SubjectFull: X-ray diffraction
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      – TitleFull: USE OF A CONVOLUTION METHOD AT LINEAR INTERVALS IN X-RAY DIFFRACTION PROFILES.
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              Text: 7/15/2024
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              Y: 2024
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