Bibliographic Details
| Title: |
Measurement of e+e---> micro+ micro-: A test of electroweak theories. |
| Authors: |
Adeva B, Becker U, Becker-Szendy R, Berdugo J, Boehm A, Branson JG, Burger JD, Capell M, Cerrada M, Chang CC, Chang YH, Chen HS, Chen M, Chen ML, Chen MY, Chu YS, Deffur E, Deiters K, Demarteau M, Dong BZ, Duinker P, Fesefeldt HS, Fong D, Fukushima M, Garrido L, Han RD, Harting D, Herten G, Ho MC, Hueser D, Hussain M, Ilyas MM, Jiang DZ, Klein M, Krenz W, Kuijer P, Leiste R, Li QZ, Linnhoefer D, Luckey D, Luit EJ, Mana C, Marquina MA, Martinez M, Massaro GG, Mnich J, Mount R, Nadeem K, Newman H, Nowak WD, Pohl M, Poschmann FP, Rau RR, Rodriguez S, Rohde M, Rubio JA, Rykaczewski H, Sachwitz M, Salicio J, Schreiber HJ, Schroeder U, Schug J, Stone H, Swider GM |
| Source: |
Physical review letters [Phys Rev Lett] 1985 Aug 12; Vol. 55 (7), pp. 665-668. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: American Physical Society Country of Publication: United States NLM ID: 0401141 Publication Model: Print Cited Medium: Internet ISSN: 1079-7114 (Electronic) Linking ISSN: 00319007 NLM ISO Abbreviation: Phys Rev Lett |
| Database: |
MEDLINE Ultimate |
