Bibliographic Details
| Title: |
Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale. |
| Authors: |
Howe JM; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904-4745, USA. jh9s@virginia.edu, Oleshko VP |
| Source: |
Journal of electron microscopy [J Electron Microsc (Tokyo)] 2004; Vol. 53 (4), pp. 339-51. |
| Publication Type: |
Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: |
Publisher: Japanese Society of Electron Microscopy Country of Publication: Japan NLM ID: 7611157 Publication Model: Print Cited Medium: Print ISSN: 0022-0744 (Print) Linking ISSN: 00220744 NLM ISO Abbreviation: J Electron Microsc (Tokyo) Subsets: MEDLINE |
| Database: |
MEDLINE Ultimate |
