APA (7th ed.) Citation

JM, H., & VP, O. (2004). Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale. Journal of electron microscopy, 53(4), 339. https://doi.org/10.1093/jmicro/dfh044

Chicago Style (17th ed.) Citation

JM, Howe, and Oleshko VP. "Application of Valence Electron Energy-loss Spectroscopy and Plasmon Energy Mapping for Determining Material Properties at the Nanoscale." Journal of Electron Microscopy 53, no. 4 (2004): 339. https://doi.org/10.1093/jmicro/dfh044.

MLA (9th ed.) Citation

JM, Howe, and Oleshko VP. "Application of Valence Electron Energy-loss Spectroscopy and Plasmon Energy Mapping for Determining Material Properties at the Nanoscale." Journal of Electron Microscopy, vol. 53, no. 4, 2004, p. 339, https://doi.org/10.1093/jmicro/dfh044.