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Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale.

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Title: Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale.
Authors: Howe JM; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904-4745, USA. jh9s@virginia.edu, Oleshko VP
Source: Journal of electron microscopy [J Electron Microsc (Tokyo)] 2004; Vol. 53 (4), pp. 339-51.
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
Journal Info: Publisher: Japanese Society of Electron Microscopy Country of Publication: Japan NLM ID: 7611157 Publication Model: Print Cited Medium: Print ISSN: 0022-0744 (Print) Linking ISSN: 00220744 NLM ISO Abbreviation: J Electron Microsc (Tokyo) Subsets: MEDLINE
Database: MEDLINE Ultimate
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PubType: Academic Journal
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  Data: Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale.
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  Data: <searchLink fieldCode="AU" term="%22Howe+JM%22">Howe JM</searchLink>; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904-4745, USA. jh9s@virginia.edu<br /><searchLink fieldCode="AU" term="%22Oleshko+VP%22">Oleshko VP</searchLink>
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  Data: <searchLink fieldCode="JN" term="%227611157%22">Journal of electron microscopy</searchLink> [J Electron Microsc (Tokyo)] 2004; Vol. 53 (4), pp. 339-51.
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  Data: Journal Article; Research Support, Non-U.S. Gov't
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Japanese+Society+of+Electron+Microscopy%22">Japanese Society of Electron Microscopy </searchLink><i>Country of Publication: </i>Japan <i>NLM ID: </i>7611157 <i>Publication Model: </i>Print <i>Cited Medium: </i>Print <i>ISSN: </i>0022-0744 (Print) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2200220744%22">00220744 </searchLink><i>NLM ISO Abbreviation: </i>J Electron Microsc (Tokyo) <i>Subsets: </i>MEDLINE
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        Value: 10.1093/jmicro/dfh044
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      – Code: eng
        Text: English
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        StartPage: 339
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      – TitleFull: Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale.
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            NameFull: Howe JM
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            NameFull: Oleshko VP
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              Text: 2004
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              Y: 2004
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              Value: 53
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              Value: 4
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            – TitleFull: Journal of electron microscopy
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