Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale.
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| Title: | Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale. |
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| Authors: | Howe JM; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904-4745, USA. jh9s@virginia.edu, Oleshko VP |
| Source: | Journal of electron microscopy [J Electron Microsc (Tokyo)] 2004; Vol. 53 (4), pp. 339-51. |
| Publication Type: | Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: | Publisher: Japanese Society of Electron Microscopy Country of Publication: Japan NLM ID: 7611157 Publication Model: Print Cited Medium: Print ISSN: 0022-0744 (Print) Linking ISSN: 00220744 NLM ISO Abbreviation: J Electron Microsc (Tokyo) Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
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