Bibliographic Details
| Title: |
Multiple means to the same end: the genetic basis of acquired stress resistance in yeast. |
| Authors: |
Berry DB; Laboratory of Genetics, University of Wisconsin-Madison, Madison, Wisconsin, United States of America., Guan Q, Hose J, Haroon S, Gebbia M, Heisler LE, Nislow C, Giaever G, Gasch AP |
| Source: |
PLoS genetics [PLoS Genet] 2011 Nov; Vol. 7 (11), pp. e1002353. Date of Electronic Publication: 2011 Nov 10. |
| Publication Type: |
Journal Article; Research Support, N.I.H., Extramural; Research Support, Non-U.S. Gov't |
| Journal Info: |
Publisher: Public Library of Science Country of Publication: United States NLM ID: 101239074 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1553-7404 (Electronic) Linking ISSN: 15537390 NLM ISO Abbreviation: PLoS Genet Subsets: MEDLINE |
| Database: |
MEDLINE Ultimate |
