Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor.
Saved in:
| Title: | Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor. |
|---|---|
| Authors: | Gontard LC; Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, UK., Moldovan G, Carmona-Galán R, Lin C, Kirkland AI |
| Source: | Microscopy (Oxford, England) [Microscopy (Oxf)] 2014 Apr; Vol. 63 (2), pp. 119-30. Date of Electronic Publication: 2014 Jan 08. |
| Publication Type: | Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: | Publisher: Oxford University Press Country of Publication: England NLM ID: 101595834 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2050-5701 (Electronic) Linking ISSN: 20505698 NLM ISO Abbreviation: Microscopy (Oxf) Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
Be the first to leave a comment!
