| Authors: |
Talwalkar A; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Liptrap J; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Newcomb J; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Hartl C; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Terhorst J; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Curtis K; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Bresler M; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Song YS; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Jordan MI; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA., Patterson D; Department of Electrical Engineering and Computer Science, UC Berkeley, Berkeley, CA 94720, USA, The Broad Institute of Harvard and MIT, Cambridge, MA 02142, USA and Department of Statistics, UC Berkeley, Berkeley, CA 94720, USA. |
