| Authors: |
Wei P; Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.; Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Lee S; IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA.; Electrical Engineering Department, Columbia University, New York, New York 10027, USA., Lemaitre F; IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA.; Institut polytechnique de Grenoble, F38031 Grenoble Cedex 1, France., Pinel L; IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA.; Institut polytechnique de Grenoble, F38031 Grenoble Cedex 1, France., Cutaia D; IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA.; IBM Zurich Research Laboratory, Säumerstrasse 4, CH- 8803 Rüschlikon, Switzerland., Cha W; Mechanical Engineering Department, Columbia University, New York, New York 10027, USA., Katmis F; Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.; Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Zhu Y; IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA., Heiman D; Department of Physics, Northeastern University, Boston, Massachusetts 02115, USA., Hone J; Mechanical Engineering Department, Columbia University, New York, New York 10027, USA., Moodera JS; Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.; Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Chen CT; IBM TJ Watson Research Center, Yorktown Heights, New York 10598, USA. |
