20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX).

Saved in:
Bibliographic Details
Title: 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX).
Authors: Castner DG; Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195-1653.
Source: Biointerphases [Biointerphases] 2016 Jun 07; Vol. 11 (2), pp. 02A101. Date of Electronic Publication: 2016 Jun 07.
Publication Type: Conference Proceedings; Editorial
Journal Info: Publisher: AIP Publishing Country of Publication: United States NLM ID: 101275679 Publication Model: Electronic Cited Medium: Internet ISSN: 1559-4106 (Electronic) Linking ISSN: 15594106 NLM ISO Abbreviation: Biointerphases Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1559-4106
DOI:10.1116/1.4945800