Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications.
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| Title: | Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications. |
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| Authors: | Benavidez TE; Department of Chemistry, Clemson University, Clemson, SC, USA., Garcia CD; Department of Chemistry, Clemson University, Clemson, SC, USA. cdgarci@clemson.edu. |
| Source: | Electrophoresis [Electrophoresis] 2016 Oct; Vol. 37 (19), pp. 2509-2516. Date of Electronic Publication: 2016 Jun 27. |
| Publication Type: | Journal Article; Research Support, Non-U.S. Gov't |
| Journal Info: | Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 8204476 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1522-2683 (Electronic) Linking ISSN: 01730835 NLM ISO Abbreviation: Electrophoresis Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 1522-2683 |
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| DOI: | 10.1002/elps.201600143 |
