APA (7th ed.) Citation

TE, B., & CD, G. (2016). Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications. Electrophoresis, 37(19), 2509. https://doi.org/10.1002/elps.201600143

Chicago Style (17th ed.) Citation

TE, Benavidez, and Garcia CD. "Spectroscopic Ellipsometry as a Complementary Tool to Characterize Coatings on PDMS for CE Applications." Electrophoresis 37, no. 19 (2016): 2509. https://doi.org/10.1002/elps.201600143.

MLA (9th ed.) Citation

TE, Benavidez, and Garcia CD. "Spectroscopic Ellipsometry as a Complementary Tool to Characterize Coatings on PDMS for CE Applications." Electrophoresis, vol. 37, no. 19, 2016, p. 2509, https://doi.org/10.1002/elps.201600143.