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Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications.

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Title: Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications.
Authors: Benavidez TE; Department of Chemistry, Clemson University, Clemson, SC, USA., Garcia CD; Department of Chemistry, Clemson University, Clemson, SC, USA. cdgarci@clemson.edu.
Source: Electrophoresis [Electrophoresis] 2016 Oct; Vol. 37 (19), pp. 2509-2516. Date of Electronic Publication: 2016 Jun 27.
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 8204476 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1522-2683 (Electronic) Linking ISSN: 01730835 NLM ISO Abbreviation: Electrophoresis Subsets: MEDLINE
Database: MEDLINE Ultimate
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Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 27240815
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Benavidez+TE%22">Benavidez TE</searchLink>; Department of Chemistry, Clemson University, Clemson, SC, USA.<br /><searchLink fieldCode="AU" term="%22Garcia+CD%22">Garcia CD</searchLink>; Department of Chemistry, Clemson University, Clemson, SC, USA. cdgarci@clemson.edu.
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%228204476%22">Electrophoresis</searchLink> [Electrophoresis] 2016 Oct; Vol. 37 (19), pp. 2509-2516. <i>Date of Electronic Publication: </i>2016 Jun 27.
– Name: TypePub
  Label: Publication Type
  Group: TypPub
  Data: Journal Article; Research Support, Non-U.S. Gov't
– Name: TitleSource
  Label: Journal Info
  Group: Src
  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley-VCH%22">Wiley-VCH </searchLink><i>Country of Publication: </i>Germany <i>NLM ID: </i>8204476 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1522-2683 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2201730835%22">01730835 </searchLink><i>NLM ISO Abbreviation: </i>Electrophoresis <i>Subsets: </i>MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=27240815
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1002/elps.201600143
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        StartPage: 2509
    Titles:
      – TitleFull: Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Benavidez TE
      – PersonEntity:
          Name:
            NameFull: Garcia CD
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Text: 2016 Oct
              Type: published
              Y: 2016
          Identifiers:
            – Type: issn-electronic
              Value: 1522-2683
          Numbering:
            – Type: volume
              Value: 37
            – Type: issue
              Value: 19
          Titles:
            – TitleFull: Electrophoresis
              Type: main
ResultId 1