Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials.
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| Title: | Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials. |
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| Authors: | Majhi A; Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology, Indore, 452013, India.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India., Nayak M; Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology, Indore, 452013, India. mnayak@rrcat.gov.in.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India. mnayak@rrcat.gov.in., Pradhan PC; Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology, Indore, 452013, India.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India., Filatova EO; St Petersburg State University, Ulyanovskaya 3, Peterhof, St Petersburg, 198504, Russian Federation., Sokolov A; Helmholtz-Zentrum Berlin, Institute for Nanometre Optics and Technology, Berlin, Germany., Schäfers F; Helmholtz-Zentrum Berlin, Institute for Nanometre Optics and Technology, Berlin, Germany. |
| Source: | Scientific reports [Sci Rep] 2018 Oct 24; Vol. 8 (1), pp. 15724. Date of Electronic Publication: 2018 Oct 24. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 2045-2322 |
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| DOI: | 10.1038/s41598-018-34076-5 |
