Neutron detection performance of gallium nitride based semiconductors.

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Bibliographic Details
Title: Neutron detection performance of gallium nitride based semiconductors.
Authors: Zhou C; Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA., Melton AG; Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, North Carolina, 28223, USA., Burgett E; Nuclear Engineering Program, Idaho State University, Pocatello, Idaho, 83209, USA., Hertel N; Nuclear Engineering Program, Georgia Institute of Technology, Atlanta, Georgia, 30332, USA., Ferguson IT; Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA. ianf@mst.edu.; Southern Polytechnic College of Engineering and Engineering Technology, Kennesaw State University, Marietta, GA, 30060, USA. ianf@mst.edu.
Source: Scientific reports [Sci Rep] 2019 Nov 26; Vol. 9 (1), pp. 17551. Date of Electronic Publication: 2019 Nov 26.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2045-2322
DOI:10.1038/s41598-019-53664-7