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Neutron detection performance of gallium nitride based semiconductors.

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Title: Neutron detection performance of gallium nitride based semiconductors.
Authors: Zhou C; Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA., Melton AG; Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, North Carolina, 28223, USA., Burgett E; Nuclear Engineering Program, Idaho State University, Pocatello, Idaho, 83209, USA., Hertel N; Nuclear Engineering Program, Georgia Institute of Technology, Atlanta, Georgia, 30332, USA., Ferguson IT; Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA. ianf@mst.edu.; Southern Polytechnic College of Engineering and Engineering Technology, Kennesaw State University, Marietta, GA, 30060, USA. ianf@mst.edu.
Source: Scientific reports [Sci Rep] 2019 Nov 26; Vol. 9 (1), pp. 17551. Date of Electronic Publication: 2019 Nov 26.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: <searchLink fieldCode="AU" term="%22Zhou+C%22">Zhou C</searchLink>; Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA.<br /><searchLink fieldCode="AU" term="%22Melton+AG%22">Melton AG</searchLink>; Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, North Carolina, 28223, USA.<br /><searchLink fieldCode="AU" term="%22Burgett+E%22">Burgett E</searchLink>; Nuclear Engineering Program, Idaho State University, Pocatello, Idaho, 83209, USA.<br /><searchLink fieldCode="AU" term="%22Hertel+N%22">Hertel N</searchLink>; Nuclear Engineering Program, Georgia Institute of Technology, Atlanta, Georgia, 30332, USA.<br /><searchLink fieldCode="AU" term="%22Ferguson+IT%22">Ferguson IT</searchLink>; Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA. ianf@mst.edu.; Southern Polytechnic College of Engineering and Engineering Technology, Kennesaw State University, Marietta, GA, 30060, USA. ianf@mst.edu.
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  Data: <searchLink fieldCode="JN" term="%22101563288%22">Scientific reports</searchLink> [Sci Rep] 2019 Nov 26; Vol. 9 (1), pp. 17551. <i>Date of Electronic Publication: </i>2019 Nov 26.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Nature+Publishing+Group%22">Nature Publishing Group </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101563288 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2045-2322 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220452322%22">20452322 </searchLink><i>NLM ISO Abbreviation: </i>Sci Rep <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1038/s41598-019-53664-7
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              Text: 2019 Nov 26
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