Bibliographic Details
| Title: |
Full-field vibration profilometry using time-averaged interference microscopy aided by variational analysis. |
| Authors: |
Cywińska M, Trusiak M, Styk A, Patorski K |
| Source: |
Optics express [Opt Express] 2020 Jan 06; Vol. 28 (1), pp. 435-450. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: MEDLINE; PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
