| Authors: |
Avraham M; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 32000, Israel.; Department of Electrical Engineering and Electronics, Ariel University, Ariel 40700, Israel., Stolyarova S; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 32000, Israel., Blank T; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 32000, Israel., Bar-Lev S; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 32000, Israel., Golan G; Department of Electrical Engineering and Electronics, Ariel University, Ariel 40700, Israel., Nemirovsky Y; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 32000, Israel. |