Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions.
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| Title: | Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions. |
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| Authors: | Llovet X; Centres Científics i Tecnològics, Universitat de Barcelona, Lluís Solé i Sabarís, 1-3, Barcelona08028, Spain., Proenza JA; Departament de Mineralogia, Petrologia i Geologia Aplicada, Universitat de Barcelona, Martí i Franqués s/n, Barcelona08028, Spain., Pujol-Solà N; Departament de Mineralogia, Petrologia i Geologia Aplicada, Universitat de Barcelona, Martí i Franqués s/n, Barcelona08028, Spain., Farré-de-Pablo J; Departament de Mineralogia, Petrologia i Geologia Aplicada, Universitat de Barcelona, Martí i Franqués s/n, Barcelona08028, Spain., Campeny M; Departament de Mineralogia, Museu de Ciències Naturals de Barcelona, Passeig Picasso s/n, Barcelona08003, Spain. |
| Source: | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2020 Oct; Vol. 26 (5), pp. 895-905. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 1435-8115 |
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| DOI: | 10.1017/S1431927620024393 |
