APA (7th ed.) Citation

X, L., JA, P., N, P., J, F., & M, C. (2020). Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 26(5), 895. https://doi.org/10.1017/S1431927620024393

Chicago Style (17th ed.) Citation

X, Llovet, Proenza JA, Pujol-Solà N, Farré-de-Pablo J, and Campeny M. "Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions." Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 26, no. 5 (2020): 895. https://doi.org/10.1017/S1431927620024393.

MLA (9th ed.) Citation

X, Llovet, et al. "Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions." Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 26, no. 5, 2020, p. 895, https://doi.org/10.1017/S1431927620024393.