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Corrigendum to "Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmions" [Ultramicroscopy 212 (2020) 112973].

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Title: Corrigendum to "Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmions" [Ultramicroscopy 212 (2020) 112973].
Authors: Pöllath S; Institut für Experimentelle Physik, Universität Regensburg, D-93040 Regensburg, Germany. Electronic address: simon.poellath@ur.de., Lin T; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, Beijing, 100191, China., Lei N; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, Beijing, 100191, China., Zhao W; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, Beijing, 100191, China., Zweck J; Institut für Experimentelle Physik, Universität Regensburg, D-93040 Regensburg, Germany., Back CH; Physik-Department, Technische Universität München, D-85748 Garching, Germany; Munich Center for Quantum Science and Technology (MCQST), Schellingstr. 4, D-80799 München, Germany. Electronic address: christian.back@tum.de.
Source: Ultramicroscopy [Ultramicroscopy] 2021 Apr; Vol. 223, pp. 113224. Date of Electronic Publication: 2021 Feb 11.
Publication Type: Published Erratum
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Corrigendum to "Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmions" [Ultramicroscopy 212 (2020) 112973].
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  Data: <searchLink fieldCode="AU" term="%22Pöllath+S%22">Pöllath S</searchLink>; Institut für Experimentelle Physik, Universität Regensburg, D-93040 Regensburg, Germany. Electronic address: simon.poellath@ur.de.<br /><searchLink fieldCode="AU" term="%22Lin+T%22">Lin T</searchLink>; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, Beijing, 100191, China.<br /><searchLink fieldCode="AU" term="%22Lei+N%22">Lei N</searchLink>; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, Beijing, 100191, China.<br /><searchLink fieldCode="AU" term="%22Zhao+W%22">Zhao W</searchLink>; Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, Beijing, 100191, China.<br /><searchLink fieldCode="AU" term="%22Zweck+J%22">Zweck J</searchLink>; Institut für Experimentelle Physik, Universität Regensburg, D-93040 Regensburg, Germany.<br /><searchLink fieldCode="AU" term="%22Back+CH%22">Back CH</searchLink>; Physik-Department, Technische Universität München, D-85748 Garching, Germany; Munich Center for Quantum Science and Technology (MCQST), Schellingstr. 4, D-80799 München, Germany. Electronic address: christian.back@tum.de.
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  Data: <searchLink fieldCode="JN" term="%227513702%22">Ultramicroscopy</searchLink> [Ultramicroscopy] 2021 Apr; Vol. 223, pp. 113224. <i>Date of Electronic Publication: </i>2021 Feb 11.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Elsevier%22">Elsevier </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>7513702 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1879-2723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2203043991%22">03043991 </searchLink><i>NLM ISO Abbreviation: </i>Ultramicroscopy <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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      – Type: doi
        Value: 10.1016/j.ultramic.2021.113224
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      – Code: eng
        Text: English
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      – TitleFull: Corrigendum to "Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmions" [Ultramicroscopy 212 (2020) 112973].
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            NameFull: Pöllath S
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            NameFull: Lin T
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            NameFull: Lei N
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            NameFull: Zhao W
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            NameFull: Zweck J
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              Text: 2021 Apr
              Type: published
              Y: 2021
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              Value: 1879-2723
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              Value: 223
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