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Consistent safety and tolerability of Valtoco® (diazepam nasal spray) in relationship to usage frequency in patients with seizure clusters: Interim results from a phase 3, long-term, open-label, repeat-dose safety study.

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Title: Consistent safety and tolerability of Valtoco® (diazepam nasal spray) in relationship to usage frequency in patients with seizure clusters: Interim results from a phase 3, long-term, open-label, repeat-dose safety study.
Authors: Miller I; Formerly Nicklaus Children's Hospital, Miami, FL, USA., Wheless JW; Le Bonheur Children's Hospital, University of Tennessee Health Science Center, Memphis, TN, USA., Hogan RE; Washington University in St. Louis, St. Louis, MO, USA., Dlugos D; Children's Hospital of Philadelphia, Philadelphia, PA, USA., Biton V; Arkansas Epilepsy Program, Little Rock, AR, USA., Cascino GD; Mayo Clinic, Rochester, MN, USA., Sperling MR; Thomas Jefferson University, Philadelphia, PA, USA., Liow K; Hawaii Pacific Neuroscience, Honolulu, HI, USA., Vazquez B; Comprehensive Epilepsy Center, New York University, New York, NY, USA., Segal EB; Hackensack University Medical Center and Northeast Regional Epilepsy Group, Hackensack, NJ, USA., Tarquinio D; Center for Rare Neurological Diseases, Atlanta, GA, USA., Mauney W; Northwest Florida Clinical Research Group, Gulf Breeze, FL, USA., Desai J; Children's Hospital of Los Angeles, Los Angeles, CA, USA., Rabinowicz AL; Neurelis, Inc., San Diego, CA, USA., Carrazana E; Neurelis, Inc., San Diego, CA, USA.
Corporate Authors: DIAZ.001.05 Study Group
Source: Epilepsia open [Epilepsia Open] 2021 Sep; Vol. 6 (3), pp. 504-512. Date of Electronic Publication: 2021 May 13.
Publication Type: Clinical Trial, Phase III; Journal Article; Research Support, Non-U.S. Gov't
Journal Info: Publisher: John Wiley & Sons, Inc Country of Publication: United States NLM ID: 101692036 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2470-9239 (Electronic) Linking ISSN: 24709239 NLM ISO Abbreviation: Epilepsia Open Subsets: MEDLINE
Database: MEDLINE Ultimate
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ISSN:2470-9239
DOI:10.1002/epi4.12494