APA (7th ed.) Citation

SJ, C., CY, T., YJ, L., TM, W., MH, L., BH, L., . . . YC, T. (2021). Visualizing Ferroelectric Uniformity of Hf1-xZrxO2 Films Using X-ray Mapping. ACS applied materials & interfaces, 13(24), 29212. https://doi.org/10.1021/acsami.1c08265

Chicago Style (17th ed.) Citation

SJ, Chang, et al. "Visualizing Ferroelectric Uniformity of Hf1-xZrxO2 Films Using X-ray Mapping." ACS Applied Materials & Interfaces 13, no. 24 (2021): 29212. https://doi.org/10.1021/acsami.1c08265.

MLA (9th ed.) Citation

SJ, Chang, et al. "Visualizing Ferroelectric Uniformity of Hf1-xZrxO2 Films Using X-ray Mapping." ACS Applied Materials & Interfaces, vol. 13, no. 24, 2021, p. 29212, https://doi.org/10.1021/acsami.1c08265.