Bibliographic Details
| Title: |
Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography". |
| Authors: |
Vidas L, Günther CM, Miller TA, Pfau B, Perez-Salinas D, Martínez E, Schneider M, Gührs E, Gargiani P, Valvidares M, Marvel RE, Hallman KA, Haglund RF Jr, Eisebitt S, Wall S |
| Source: |
Nano letters [Nano Lett] 2021 Sep 08; Vol. 21 (17), pp. 7426. Date of Electronic Publication: 2021 Aug 19. |
| Publication Type: |
Published Erratum |
| Journal Info: |
Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
