APA (7th ed.) Citation

L, V., CM, G., TA, M., B, P., D, P., E, M., . . . S, W. (2021). Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography". Nano letters, 21(17), 7426. https://doi.org/10.1021/acs.nanolett.1c03109

Chicago Style (17th ed.) Citation

L, Vidas, et al. "Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography"." Nano Letters 21, no. 17 (2021): 7426. https://doi.org/10.1021/acs.nanolett.1c03109.

MLA (9th ed.) Citation

L, Vidas, et al. "Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography"." Nano Letters, vol. 21, no. 17, 2021, p. 7426, https://doi.org/10.1021/acs.nanolett.1c03109.