Author Correction: Ternary logic decoder using independently controlled double-gate Si-NW MOSFETs.

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Title: Author Correction: Ternary logic decoder using independently controlled double-gate Si-NW MOSFETs.
Authors: Han SJ; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Han JK; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Kim MS; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Yun GJ; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Yu JM; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Tcho IW; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Seo M; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Lee GB; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea., Choi YK; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak‑ro, Yuseong‑gu, Daejeon, 34141, Republic of Korea. ykchoi@ee.kaist.ac.kr.
Source: Scientific reports [Sci Rep] 2021 Aug 19; Vol. 11 (1), pp. 17165. Date of Electronic Publication: 2021 Aug 19.
Publication Type: Published Erratum
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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ISSN:2045-2322
DOI:10.1038/s41598-021-96555-6