| Authors: |
Lee DY; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States., Na DY; School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, United States., Góngora-Canul C; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States.; Tecnológico Nacional de México, Instituto Tecnológico de Conkal, Yucatán, Mexico., Baireddy S; School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, United States., Lane B; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States., Cruz AP; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States., Fernández-Campos M; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States., Kleczewski NM; Department of Crop Science, University of Illinois, Urbana, IL, United States., Telenko DEP; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States., Goodwin SB; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States.; U.S. Department of Agriculture-Agricultural Research Service, West Lafayette, IN, United States., Delp EJ; School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, United States., Cruz CD; Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN, United States. |
