| Authors: |
Wang S; School of Instrumentation Science and Engineering, Harbin Institute of Technology (HIT), Harbin 150001, China; Univ Lyon, INSA-Lyon, Université Claude Bernard Lyon 1, CNRS, Inserm, CREATIS UMR 5220, U1294, F-69621, Lyon, France. Electronic address: m.wangshunli@qq.com., Varray F; Univ Lyon, INSA-Lyon, Université Claude Bernard Lyon 1, CNRS, Inserm, CREATIS UMR 5220, U1294, F-69621, Lyon, France. Electronic address: francois.varray@creatis.insa-lyon.fr., Liu W; Sino European School of Technology, Shanghai University, Shanghai 200444, China. Electronic address: liuwanyu@shu.edu.cn., Clarysse P; Univ Lyon, INSA-Lyon, Université Claude Bernard Lyon 1, CNRS, Inserm, CREATIS UMR 5220, U1294, F-69621, Lyon, France. Electronic address: patrick.clarysse@creatis.insa-lyon.fr., Magnin IE; Univ Lyon, INSA-Lyon, Université Claude Bernard Lyon 1, CNRS, Inserm, CREATIS UMR 5220, U1294, F-69621, Lyon, France. Electronic address: isabelle.magnin@creatis.insa-lyon.fr. |