| Authors: |
Mou XY; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn., Guo YD; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn.; Key Laboratory of Radio Frequency and Micro-Nano Electronics of Jiangsu Province, Nanjing 210023, China., Yan XH; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn.; Key Laboratory of Radio Frequency and Micro-Nano Electronics of Jiangsu Province, Nanjing 210023, China.; College of Science, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China.; School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, China., Lin LY; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn.; Key Laboratory of Radio Frequency and Micro-Nano Electronics of Jiangsu Province, Nanjing 210023, China., Rao MQ; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn., Xing JY; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn., Xu XR; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn., Wang HN; College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China. yandongguo@njupt.edu.cn. |
