| Authors: |
Yang YL; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Chen JX; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Guo F; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Huang M; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Liang SS; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Li QL; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Hu JF; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn., Zhao JT; School of Materials Science and Engineering, Guilin University of Electronic Technology, Guilin 541004, P.R. China., Gao XY; Shanghai Synchrotron Radiation Facility (SSRF), Zhangjiang Lab, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, P. R. China., Fu YN; Shanghai Synchrotron Radiation Facility (SSRF), Zhangjiang Lab, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, P. R. China., Lin H; Engineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Morden Optical System, University of Shanghai for Science and Technology, No. 516 Jun gong Road, Shanghai, 200093, P. R. China., Cheng S; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn.; School of Materials Science and Engineering, Guilin University of Electronic Technology, Guilin 541004, P.R. China., Zhang ZJ; School of Materials Science and Engineering, Shanghai University, Shanghai 200444, P.R. China. zhangzhijun@shu.edu.cn. |
