| Authors: |
Shi J; Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA, USA., Yoo D; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA., Vidal-Codina F; Department of Aeronautics and Astronautics, Massachusetts Institute of Technology, Cambridge, MA, USA., Baik CW; Advanced Sensor Lab, Samsung Advanced Institute of Technology, Suwon, Republic of Korea., Cho KS; Advanced Sensor Lab, Samsung Advanced Institute of Technology, Suwon, Republic of Korea., Nguyen NC; Department of Aeronautics and Astronautics, Massachusetts Institute of Technology, Cambridge, MA, USA., Utzat H; Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA, USA.; College of Chemistry, University of California, Berkeley, CA, USA., Han J; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Lindenberg AM; Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.; Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA, USA.; Stanford PULSE Institute, SLAC National Accelerator Laboratory, Menlo Park, CA, USA.; Department of Photon Science, Stanford University, Stanford, CA, USA., Bulović V; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Bawendi MG; Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA, USA., Peraire J; Department of Aeronautics and Astronautics, Massachusetts Institute of Technology, Cambridge, MA, USA., Oh SH; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA. sang@umn.edu., Nelson KA; Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA, USA. kanelson@mit.edu. |
