Anisotropic photoresponse behavior of a LaAlO3 single-crystal-based vacuum-ultraviolet photodetector.

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Title: Anisotropic photoresponse behavior of a LaAlO3 single-crystal-based vacuum-ultraviolet photodetector.
Authors: Sun X; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.; Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, P. R. China., Wang D; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Memon MH; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Zhu S; State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials, Sun Yat-sen University, Guangzhou 510275, P. R. China., Yu H; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Wang H; Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, P. R. China., Fang S; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Kang Y; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Liu X; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Luo Y; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Zhang H; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Luo D; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn., Sun H; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.
Source: Nanoscale [Nanoscale] 2022 Nov 24; Vol. 14 (45), pp. 16829-16836. Date of Electronic Publication: 2022 Nov 24.
Publication Type: Journal Article
Journal Info: Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE; PubMed not MEDLINE
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  Data: Anisotropic photoresponse behavior of a LaAlO<subscript>3</subscript> single-crystal-based vacuum-ultraviolet photodetector.
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  Data: <searchLink fieldCode="AU" term="%22Sun+X%22">Sun X</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.; Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, P. R. China.<br /><searchLink fieldCode="AU" term="%22Wang+D%22">Wang D</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Memon+MH%22">Memon MH</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Zhu+S%22">Zhu S</searchLink>; State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials, Sun Yat-sen University, Guangzhou 510275, P. R. China.<br /><searchLink fieldCode="AU" term="%22Yu+H%22">Yu H</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Wang+H%22">Wang H</searchLink>; Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, P. R. China.<br /><searchLink fieldCode="AU" term="%22Fang+S%22">Fang S</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Kang+Y%22">Kang Y</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Liu+X%22">Liu X</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Luo+Y%22">Luo Y</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Zhang+H%22">Zhang H</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Luo+D%22">Luo D</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.<br /><searchLink fieldCode="AU" term="%22Sun+H%22">Sun H</searchLink>; School of Microelectronics, University of Science and Technology of China, Hefei 230029, P. R. China. haiding@ustc.edu.cn.
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  Data: <searchLink fieldCode="JN" term="%22101525249%22">Nanoscale</searchLink> [Nanoscale] 2022 Nov 24; Vol. 14 (45), pp. 16829-16836. <i>Date of Electronic Publication: </i>2022 Nov 24.
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              Text: 2022 Nov 24
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