| Authors: |
Kang Y; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Wang D; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Gao Y; Hefei National Laboratory for Physical Science at the Microscale, Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Guo S; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei, Anhui 230601, People's Republic of China., Hu K; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei, Anhui 230601, People's Republic of China., Liu B; Platform for Characterization and Test, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou, Jiangsu 215123, People's Republic of China., Fang S; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Memon MH; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Liu X; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Luo Y; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Sun X; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Luo D; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Chen W; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Li L; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Jia H; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Hu W; Hefei National Laboratory for Physical Science at the Microscale, Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China., Liu Z; Platform for Characterization and Test, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou, Jiangsu 215123, People's Republic of China., Ge B; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei, Anhui 230601, People's Republic of China., Sun H; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.; The CAS Key Laboratory of Wireless-Optical Communications, University of Science and Technology of China, Hefei, Anhui 230029, People's Republic of China. |
