APA (7th ed.) Citation

YL, C., WF, P., CJ, H., GS, C., & JS, F. (2023). Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials. Molecules (Basel, Switzerland), 28(3), . https://doi.org/10.3390/molecules28031134

Chicago Style (17th ed.) Citation

YL, Cheng, Peng WF, Huang CJ, Chen GS, and Fang JS. "Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials." Molecules (Basel, Switzerland) 28, no. 3 (2023). https://doi.org/10.3390/molecules28031134.

MLA (9th ed.) Citation

YL, Cheng, et al. "Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials." Molecules (Basel, Switzerland), vol. 28, no. 3, 2023, https://doi.org/10.3390/molecules28031134.