| Authors: |
Fang S; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Li L; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Wang W; Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, 230026, P. R. China., Chen W; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Wang D; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Kang Y; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Liu X; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Jia H; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Luo Y; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Yu H; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Memon MH; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China., Hu W; Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, 230026, P. R. China., Ooi BS; Photonics Laboratory, Computer, Electrical, and Mathematical Sciences and Engineering (CEMSE), King Abdullah University of Science and Technology, 21534, Thuwal, Saudi Arabia., He JH; Department of Materials Science and Engineering, City University of Hong Kong, Kowloon, Hong Kong SAR, 999077, P. R. China., Sun H; School of Microelectronics, University of Science and Technology of China, Hefei, 230026, P. R. China.; The CAS Key Laboratory of Wireless-Optical Communications, University of Science and Technology of China, 230027, Hefei, P. R. China. |
