Bibliographic Details
| Title: |
Native defect clustering-induced carrier localization centers leading to a reduction of performance in Ga0.70In0.30N/GaN quantum wells. |
| Authors: |
Han DP, Kim J, Shin DS, Shim JI |
| Source: |
Optics express [Opt Express] 2023 May 08; Vol. 31 (10), pp. 15779-15790. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: MEDLINE; PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
