| Authors: |
Siddik AB; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Electrical Engineering ESAT, KU Leuven, Kasteelpark Arenberg 10, 3001 Leuven, Belgium., Georgitzikis E; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Hermans Y; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Kang J; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Electrical Engineering, Ulsan National Institute of Science and Technology, 44919 Ulsan, South Korea., Kim JH; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Pejovic V; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Electrical Engineering ESAT, KU Leuven, Kasteelpark Arenberg 10, 3001 Leuven, Belgium., Lieberman I; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Malinowski PE; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Kadashchuk A; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Institute of Physics, National Academy of Sciences of Ukraine, Prospect Nauky 46, 03028 Kyiv, Ukraine., Genoe J; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Electrical Engineering ESAT, KU Leuven, Kasteelpark Arenberg 10, 3001 Leuven, Belgium., Conard T; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Cheyns D; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Heremans P; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Electrical Engineering ESAT, KU Leuven, Kasteelpark Arenberg 10, 3001 Leuven, Belgium. |