Bibliographic Details
| Title: |
ToF-SIMS analysis of ultrathin films and their fragmentation patterns. |
| Authors: |
Muramoto S; National Institute of Standards and Technology, Gaithersburg, Maryland 20899., Graham DJ, Castner DG |
| Source: |
Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society [J Vac Sci Technol A] 2024 Mar; Vol. 42 (2), pp. 023416. Date of Electronic Publication: 2024 Feb 05. |
| Publication Type: |
Journal Article |
| Journal Info: |
Publisher: Published for the Society by the American Institute of Physics Country of Publication: United States NLM ID: 9890566 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0734-2101 (Print) Linking ISSN: 07342101 NLM ISO Abbreviation: J Vac Sci Technol A Subsets: PubMed not MEDLINE |
| Database: |
MEDLINE Ultimate |
