APA (7th ed.) Citation

S, M., DJ, G., & DG, C. (2024). ToF-SIMS analysis of ultrathin films and their fragmentation patterns. Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society, 42(2), 023416. https://doi.org/10.1116/6.0003249

Chicago Style (17th ed.) Citation

S, Muramoto, Graham DJ, and Castner DG. "ToF-SIMS Analysis of Ultrathin Films and Their Fragmentation Patterns." Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : An Official Journal of the American Vacuum Society 42, no. 2 (2024): 023416. https://doi.org/10.1116/6.0003249.

MLA (9th ed.) Citation

S, Muramoto, et al. "ToF-SIMS Analysis of Ultrathin Films and Their Fragmentation Patterns." Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : An Official Journal of the American Vacuum Society, vol. 42, no. 2, 2024, p. 023416, https://doi.org/10.1116/6.0003249.