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ToF-SIMS analysis of ultrathin films and their fragmentation patterns.

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Title: ToF-SIMS analysis of ultrathin films and their fragmentation patterns.
Authors: Muramoto S; National Institute of Standards and Technology, Gaithersburg, Maryland 20899., Graham DJ, Castner DG
Source: Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society [J Vac Sci Technol A] 2024 Mar; Vol. 42 (2), pp. 023416. Date of Electronic Publication: 2024 Feb 05.
Publication Type: Journal Article
Journal Info: Publisher: Published for the Society by the American Institute of Physics Country of Publication: United States NLM ID: 9890566 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0734-2101 (Print) Linking ISSN: 07342101 NLM ISO Abbreviation: J Vac Sci Technol A Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 38328692
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: ToF-SIMS analysis of ultrathin films and their fragmentation patterns.
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  Data: <searchLink fieldCode="JN" term="%229890566%22">Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society</searchLink> [J Vac Sci Technol A] 2024 Mar; Vol. 42 (2), pp. 023416. <i>Date of Electronic Publication: </i>2024 Feb 05.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Published+for+the+Society+by+the+American+Institute+of+Physics%22">Published for the Society by the American Institute of Physics </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>9890566 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Print <i>ISSN: </i>0734-2101 (Print) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2207342101%22">07342101 </searchLink><i>NLM ISO Abbreviation: </i>J Vac Sci Technol A <i>Subsets: </i>PubMed not MEDLINE
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1116/6.0003249
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        StartPage: 023416
    Titles:
      – TitleFull: ToF-SIMS analysis of ultrathin films and their fragmentation patterns.
        Type: main
  BibRelationships:
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      – PersonEntity:
          Name:
            NameFull: Muramoto S
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          Name:
            NameFull: Graham DJ
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          Name:
            NameFull: Castner DG
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          Dates:
            – D: 01
              M: 03
              Text: 2024 Mar
              Type: published
              Y: 2024
          Identifiers:
            – Type: issn-print
              Value: 0734-2101
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              Value: 42
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              Value: 2
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            – TitleFull: Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society
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