A Cross-Process Signal Integrity Analysis (CPSIA) Method and Design Optimization for Wafer-on-Wafer Stacked DRAM.
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| Title: | A Cross-Process Signal Integrity Analysis (CPSIA) Method and Design Optimization for Wafer-on-Wafer Stacked DRAM. |
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| Authors: | Jiang X; Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China.; School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100029, China.; Xi'an UniIC Semiconductors, Xi'an 710075, China., Jia X; Xi'an UniIC Semiconductors, Xi'an 710075, China.; School of Microelectronics, Xi'an Jiaotong University, Xianning West Road 28#, Xi'an 710049, China., Wang S; Xi'an UniIC Semiconductors, Xi'an 710075, China., Guo Y; Xi'an UniIC Semiconductors, Xi'an 710075, China., Guo F; Xi'an UniIC Semiconductors, Xi'an 710075, China., Long X; Xi'an UniIC Semiconductors, Xi'an 710075, China., Geng L; School of Microelectronics, Xi'an Jiaotong University, Xianning West Road 28#, Xi'an 710049, China., Yang J; School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100029, China., Liu M; Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China.; School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100029, China. |
| Source: | Micromachines [Micromachines (Basel)] 2024 Apr 23; Vol. 15 (5). Date of Electronic Publication: 2024 Apr 23. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: MDPI Country of Publication: Switzerland NLM ID: 101640903 Publication Model: Electronic Cited Medium: Print ISSN: 2072-666X (Print) Linking ISSN: 2072666X NLM ISO Abbreviation: Micromachines (Basel) Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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