J, P., Y, P., S, C., ZF, L., & GD, S. (2024). Fatigue behavior of freestanding nickel-molybdenum-tungsten thin films with high-density planar faults. Nanoscale, 16(25), 12050. https://doi.org/10.1039/d4nr01033g
Chicago Style (17th ed.) CitationJ, Park, Park Y, Choi S, Lee ZF, and Sim GD. "Fatigue Behavior of Freestanding Nickel-molybdenum-tungsten Thin Films with High-density Planar Faults." Nanoscale 16, no. 25 (2024): 12050. https://doi.org/10.1039/d4nr01033g.
MLA (9th ed.) CitationJ, Park, et al. "Fatigue Behavior of Freestanding Nickel-molybdenum-tungsten Thin Films with High-density Planar Faults." Nanoscale, vol. 16, no. 25, 2024, p. 12050, https://doi.org/10.1039/d4nr01033g.
Warning: These citations may not always be 100% accurate.