| Authors: |
Rashed ANZ; Electronics and Electrical Communications Engineering Department, Faculty of Electronic Engineering, Menoufia University, Menouf, 32951, Egypt. ahmed_733@yahoo.com., Yarrarapu M; Department of CSE, Prasad V Potluri Siddhartha Institute of Technology, Vijayawada, India., Prabu RT; Department of ECE, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences, SIMATS, Saveetha University, Chennai, Tamilnadu, 602105, India. thandaiah@gmail.com., Raj Antony GS; Department of Mechanical Engineering, Mohan Babu University (Erstwhile Sree Vidya Nikethan Engineering College), Tirupati, Andhra Pradesh, 517102, India., Edeswaran L; Department of ECE, Sathyabama Institute of Science and Technology, Chennai, Tamilnadu, 600119, India., Kumar ES; Department of ECE, Koneru Lakshmaiah Education Foundation, Vaddeswaram, 522302, India., Aswitha K; Department of ECE, Koneru Lakshmaiah Education Foundation, Vaddeswaram, 522302, India., Snehith N; Department of ECE, Koneru Lakshmaiah Education Foundation, Vaddeswaram, 522302, India., Ahammad SH; Department of ECE, Koneru Lakshmaiah Education Foundation, Vaddeswaram, 522302, India. |