| Authors: |
Jeong D; Department of Radiology, Stanford University, Stanford, CA, United States of America., Bark HS; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea.; Advanced Photonics Research Institute, Gwangju Institute of Science and Technology, Gwangju, Republic of Korea., Kim Y; Department of Radiology, Stanford University, Stanford, CA, United States of America., Shin J; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea.; Manufacturing Technology Center, Samsung, Hwaseong, Republic of Korea., Kim HW; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea., Oang KY; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea., Jang KH; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea., Lee K; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea., Jeong YU; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea., Baek IH; Radiation Center for Ultrafast Science, Korea Atomic Energy Research Institute, Daejeon, Republic of Korea., Levin CS; Department of Radiology, Stanford University, Stanford, CA, United States of America.; Department of Physics, Stanford University, Stanford, CA, United States of America.; Department of Bioengineering, Stanford University, Stanford, CA, United States of America.; Department of Electrical Engineering, Stanford University, Stanford, CA, United States of America. |
