Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr2xTi2(1-x)O3 Thin Films.
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| Title: | Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr |
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| Authors: | Harris SB; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Gemperline PT; Department of Physics, Auburn University, 315 Roosevelt Concourse, Auburn, Alabama 36849, United States., Rouleau CM; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Vasudevan RK; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Comes RB; Department of Physics, Auburn University, 315 Roosevelt Concourse, Auburn, Alabama 36849, United States.; Department of Materials Science and Engineering, University of Delaware, 201 DuPont Hall, Newark, Delaware 19716, United States. |
| Source: | Nano letters [Nano Lett] 2025 Apr 09; Vol. 25 (14), pp. 5867-5874. Date of Electronic Publication: 2025 Mar 31. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| ISSN: | 1530-6992 |
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| DOI: | 10.1021/acs.nanolett.5c00787 |
